The Statistical Process Control Calculator (SPCC) aids in the prediction and analysis of process yield. The calculator can be used with an HP® 50g calculator or a free PC emulator. Steve Edwards, an ...

Fuzzy control charts represent a significant evolution in Statistical Process Control (SPC) by addressing intrinsic uncertainties in measurement and human evaluation that classical approaches often ...

This asynchronous course addresses the basic theory behind Statistical Process Control (SPC), a method used in monitoring and controlling the quality of a process through statistical analysis to ...

A medical device manufacturer ditched a clunky ERP module for quality inspection, opting instead for specialized statistical process control software. Upgrading to new software costs time and money ...

Advanced packaging is transforming semiconductor manufacturing into a multi-dimensional challenge, blending 2D front-end wafer fabrication with 2.5D/3D assemblies, high-frequency device ...

Increasingly tight tolerances and rigorous demands for quality are forcing chipmakers and equipment manufacturers to ferret out minor process variances, which can create significant anomalies in ...

LSI Logic (www.lsilogic.com) has announced the release of its Statistical Post-Processing test methodology for defect screening on deep-submicron system-on-chip (SOC) designs. Developed in ...